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Investigation of the adsorption behavior of polymethacrylic
acid on silicon substrates
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Kostruba A.M., Fedorko V.F., Skorobogaty Ya.P., Korodenko G.D.
Thickness and optical parameters of the adsorption polymer layers of
polymethacrylic acid (PMAA) from water solution was investigated. Null-ellipsometry
technique is used for in-situ determination of the adsorbed layer parameters.
Two calculation methods are used for solving of the inverse ellipsometry
problem for the suggested two-layer model of the surface. Adsorbed amount
in the equilibrium state of the layers is calculated for the polymers with
different molecular characteristics and corresponding adsorption isotherms
are obtained.
Key words: ellipsometry, adsorption, polymethacrylic acid, surface
layers
doi 10.3116/16091833/2/1/21/2001 |
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